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DTSTAMP:20230103T035306Z
LOCATION:Auditorium\, Level 5\, West Wing
DTSTART;TZID=Asia/Seoul:20221206T100000
DTEND;TZID=Asia/Seoul:20221206T120000
UID:siggraphasia_SIGGRAPH Asia 2022_sess153_papers_181@linklings.com
SUMMARY:Direct acquisition of volumetric scattering phase function using s
 peckle correlations
DESCRIPTION:Technical Papers\n\nDirect acquisition of volumetric scatterin
 g phase function using speckle correlations\n\nAlterman, Saiko, Levin\n\nI
 n material acquisition we want to infer the internal properties of materia
 ls  from the way they scatter light.  In particular, we are interested in 
 measuring the phase function of the material, governing the amount of ener
 gy scattered towards different directions.  This phase function has been s
 hown to carry a lot of information about the type and size of particles di
 spersed in the medium, and is therefore essential for its characterization
 .\n\nPrevious approaches  to this task  have relied on computationally cos
 tly inverse rendering optimization. Alternatively, if the material can be 
 made optically thin enough so that most light paths scatter only once, thi
 s optimization can be avoided and the phase function can be directly read 
 from the profile of light scattering at different angles. However, in many
  realistic applications,  it is not easy to slice or dilute the material s
 o that  it  is thin enough for such a single scattering model to hold. \n\
 nIn this work we suggest a simple closed-form approach for acquiring mater
 ial parameters from thick samples, avoiding costly  optimization. Our appr
 oach is based on imaging the material of interest under coherent laser lig
 ht and capturing speckle patterns. We show  that memory-effect  correlatio
 ns between speckle patterns produced under nearby illumination directions 
 provide a gating mechanism, allowing us to measure the singly scattered co
 mponent of the light, even when observing thick samples where most light i
 s scattered multiple times.\n\nWe have built an experimental prototype cap
 able of measuring phase functions over a narrow angular cone. We test the 
 accuracy of our approach using validation materials whose ground truth pha
 se function is known; and we use it to capture a set of everyday materials
 .\n\nRegistration Category: FULL ACCESS, EXPERIENCE PLUS ACCESS, EXPERIENC
 E ACCESS, TRADE EXHIBITOR\n\nLanguage: ENGLISH\n\nFormat: IN-PERSON
URL:https://sa2022.siggraph.org/en/full-program/?id=papers_181&sess=sess15
 3
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