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DTSTART:18871231T000000
DTSTART:19881009T020000
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BEGIN:VEVENT
DTSTAMP:20230103T035312Z
LOCATION:Room 324\, Level 3\, West Wing
DTSTART;TZID=Asia/Seoul:20221209T140000
DTEND;TZID=Asia/Seoul:20221209T153000
UID:siggraphasia_SIGGRAPH Asia 2022_sess174_papers_181@linklings.com
SUMMARY:Direct acquisition of volumetric scattering phase function using s
 peckle correlations
DESCRIPTION:Technical Communications, Technical Papers\n\nDirect acquisiti
 on of volumetric scattering phase function using speckle correlations\n\nA
 lterman, Saiko, Levin\n\nIn material acquisition we want to infer the inte
 rnal properties of materials  from the way they scatter light.  In particu
 lar, we are interested in measuring the phase function of the material, go
 verning the amount of energy scattered towards different directions.  This
  phase function has been shown to carry a lot of information about the typ
 e and size of particles dispersed in the medium, and is therefore essentia
 l for its characterization.\n\nPrevious approaches  to this task  have rel
 ied on computationally costly inverse rendering optimization. Alternativel
 y, if the material can be made optically thin enough so that most light pa
 ths scatter only once, this optimization can be avoided and the phase func
 tion can be directly read from the profile of light scattering at differen
 t angles. However, in many realistic applications,  it is not easy to slic
 e or dilute the material so that  it  is thin enough for such a single sca
 ttering model to hold. \n\nIn this work we suggest a simple closed-form ap
 proach for acquiring material parameters from thick samples, avoiding cost
 ly  optimization. Our approach is based on imaging the material of interes
 t under coherent laser light and capturing speckle patterns. We show  that
  memory-effect  correlations between speckle patterns produced under nearb
 y illumination directions provide a gating mechanism, allowing us to measu
 re the singly scattered component of the light, even when observing thick 
 samples where most light is scattered multiple times.\n\nWe have built an 
 experimental prototype capable of measuring phase functions over a narrow 
 angular cone. We test the accuracy of our approach using validation materi
 als whose ground truth phase function is known; and we use it to capture a
  set of everyday materials.\n\nRegistration Category: FULL ACCESS, ON-DEMA
 ND ACCESS\n\nLanguage: ENGLISH\n\nFormat: IN-PERSON, ON-DEMAND
URL:https://sa2022.siggraph.org/en/full-program/?id=papers_181&sess=sess17
 4
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