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DTSTAMP:20230103T035307Z
LOCATION:Auditorium\, Level 5\, West Wing
DTSTART;TZID=Asia/Seoul:20221206T100000
DTEND;TZID=Asia/Seoul:20221206T120000
UID:siggraphasia_SIGGRAPH Asia 2022_sess153_papers_436@linklings.com
SUMMARY:Reference Based Sketch Extraction via Attention Mechanism
DESCRIPTION:Technical Papers\n\nReference Based Sketch Extraction via Atte
ntion Mechanism\n\nAshtari, Seo, Kang, Cha, Noh\n\nWe propose a model that
extracts a sketch from a colorized image in such a way that the extracted
sketch has a line style similar to a given reference sketch while preserv
ing the visual content identically to the colorized image. Authentic sketc
hes drawn by artists have various sketch styles to add visual interest and
contribute feeling to the sketch. However, existing sketch-extraction met
hods generate sketches with only one style. Moreover, existing style trans
fer models fail to transfer sketch styles because they are mostly designed
to transfer textures of a source style image instead of transferring the
sparse line styles from a reference sketch. Lacking the necessary volumes
of data for standard training of translation systems, at the core of our G
AN-based solution is a self-reference sketch style generator that produces
various reference sketches with a similar style but different spatial lay
outs. We use independent attention modules to detect the edges of a colori
zed image and reference sketch as well as the visual correspondences betwe
en them. We apply several loss terms to imitate the style and enforce spar
sity in the extracted sketches. Our sketch-extraction method results in a
close imitation of a reference sketch style drawn by an artist and outperf
orms all baseline methods. Using our method, we produce a synthetic datase
t representing various sketch styles and improve the performance of auto-c
olorization models, in high demand in comics. The validity of our approach
is confirmed via qualitative and quantitative evaluations.\n\nRegistratio
n Category: FULL ACCESS, EXPERIENCE PLUS ACCESS, EXPERIENCE ACCESS, TRADE
EXHIBITOR\n\nLanguage: ENGLISH\n\nFormat: IN-PERSON
URL:https://sa2022.siggraph.org/en/full-program/?id=papers_436&sess=sess15
3
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